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Optimization and characterization of NiO thin film and the influence of thickness on the electrical properties of n-ZnO nanorods/p-NiO heterojunction

Overview of attention for article published in Semiconductor Science & Technology, September 2014
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Title
Optimization and characterization of NiO thin film and the influence of thickness on the electrical properties of n-ZnO nanorods/p-NiO heterojunction
Published in
Semiconductor Science & Technology, September 2014
DOI 10.1088/0268-1242/29/11/115009
URN
urn:nbn:se:liu:diva-112474
Authors

Ahmad Echresh, Mazhar Ali Abbasi, Morteza Zargar Shoushtari, Mansoor Farbod, Omer Nur, Magnus Willander

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 31 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 31 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 8 26%
Student > Postgraduate 4 13%
Student > Master 3 10%
Other 2 6%
Student > Bachelor 1 3%
Other 6 19%
Unknown 7 23%
Readers by discipline Count As %
Materials Science 11 35%
Physics and Astronomy 6 19%
Energy 4 13%
Chemistry 1 3%
Unknown 9 29%