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Investigation of Thermal Stability and Degradation Mechanisms in Ni-Based Ohmic Contacts to n-Type SiC for High-Temperature Gas Sensors

Overview of attention for article published in Journal of Electronic Materials, January 2009
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Title
Investigation of Thermal Stability and Degradation Mechanisms in Ni-Based Ohmic Contacts to n-Type SiC for High-Temperature Gas Sensors
Published in
Journal of Electronic Materials, January 2009
DOI 10.1007/s11664-008-0609-y
Authors

Ariel Virshup, Lisa M Porter, Dorothy Lukco, Kristina Buchholt, Lars Hultman, Anita Lloyd Spetz

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 14 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 14 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 6 43%
Researcher 2 14%
Student > Bachelor 1 7%
Student > Master 1 7%
Professor > Associate Professor 1 7%
Other 0 0%
Unknown 3 21%
Readers by discipline Count As %
Engineering 4 29%
Materials Science 4 29%
Physics and Astronomy 2 14%
Unknown 4 29%