↓ Skip to main content

Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis

Overview of attention for book
Overall attention for this book and its chapters
Altmetric Badge

Mentioned by

syllabi
3 institutions with syllabi

Citations

dimensions_citation
177 Dimensions

Readers on

mendeley
590 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
Published by
Springer, January 2009
DOI 10.1007/978-0-387-85731-2
ISBNs
978-0-387-85730-5, 978-0-387-85731-2
Authors

Echlin, Patrick

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 590 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Germany 3 <1%
Russia 3 <1%
United Kingdom 2 <1%
United States 2 <1%
Brazil 2 <1%
China 2 <1%
South Africa 1 <1%
India 1 <1%
Czechia 1 <1%
Other 9 2%
Unknown 564 96%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 139 24%
Student > Master 102 17%
Student > Bachelor 71 12%
Researcher 68 12%
Student > Doctoral Student 41 7%
Other 62 11%
Unknown 107 18%
Readers by discipline Count As %
Materials Science 114 19%
Engineering 92 16%
Chemistry 71 12%
Physics and Astronomy 40 7%
Agricultural and Biological Sciences 35 6%
Other 110 19%
Unknown 128 22%