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X Demographics
Mendeley readers
Attention Score in Context
| Title |
Temperature-Centric Reliability Analysis and Optimization of Electronic Systems Under Process Variation
|
|---|---|
| Published in |
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, December 2014
|
| DOI | 10.1109/tvlsi.2014.2371249 |
| Authors |
Ivan Ukhov, Petru Eles, Zebo Peng |
X Demographics
The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Sweden | 1 | 100% |
Demographic breakdown
| Type | Count | As % |
|---|---|---|
| Members of the public | 1 | 100% |
Mendeley readers
The data shown below were compiled from readership statistics for 13 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 13 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 6 | 46% |
| Unspecified | 1 | 8% |
| Student > Doctoral Student | 1 | 8% |
| Student > Master | 1 | 8% |
| Professor > Associate Professor | 1 | 8% |
| Other | 1 | 8% |
| Unknown | 2 | 15% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 6 | 46% |
| Computer Science | 4 | 31% |
| Agricultural and Biological Sciences | 1 | 8% |
| Unspecified | 1 | 8% |
| Unknown | 1 | 8% |
Attention Score in Context
This research output has an Altmetric Attention Score of 1. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 27 October 2015.
All research outputs
#17,289,387
of 25,377,790 outputs
Outputs from IEEE Transactions on Very Large Scale Integration (VLSI) Systems
#1,328
of 1,395 outputs
Outputs of similar age
#225,616
of 367,059 outputs
Outputs of similar age from IEEE Transactions on Very Large Scale Integration (VLSI) Systems
#10
of 12 outputs
Altmetric has tracked 25,377,790 research outputs across all sources so far. This one is in the 21st percentile – i.e., 21% of other outputs scored the same or lower than it.
So far Altmetric has tracked 1,395 research outputs from this source. They receive a mean Attention Score of 3.8. This one is in the 2nd percentile – i.e., 2% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 367,059 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 29th percentile – i.e., 29% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 12 others from the same source and published within six weeks on either side of this one. This one is in the 16th percentile – i.e., 16% of its contemporaries scored the same or lower than it.