You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
X Demographics
Mendeley readers
| Title |
Fundamentals of Electromigration-Aware Integrated Circuit Design
|
|---|---|
| Published by |
Springer International Publishing, May 2018
|
| DOI | 10.1007/978-3-319-73558-0 |
| ISBNs |
978-3-31-973557-3, 978-3-31-973558-0
|
| Authors |
Lienig, Jens, Thiele, Matthias |
X Demographics
The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Pakistan | 1 | 100% |
Demographic breakdown
| Type | Count | As % |
|---|---|---|
| Members of the public | 1 | 100% |
Mendeley readers
The data shown below were compiled from readership statistics for 88 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 88 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 16 | 18% |
| Researcher | 9 | 10% |
| Student > Master | 8 | 9% |
| Student > Doctoral Student | 5 | 6% |
| Student > Bachelor | 5 | 6% |
| Other | 11 | 13% |
| Unknown | 34 | 39% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 21 | 24% |
| Materials Science | 9 | 10% |
| Physics and Astronomy | 7 | 8% |
| Computer Science | 5 | 6% |
| Chemistry | 4 | 5% |
| Other | 9 | 10% |
| Unknown | 33 | 38% |