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| Title |
X-Ray Microscopy II
|
|---|---|
| Published by |
Springer, Berlin, Heidelberg, October 2013
|
| DOI | 10.1007/978-3-540-39246-0 |
| ISBNs |
978-3-66-214490-9, 978-3-54-039246-0, 978-3-54-019392-0
|
| Editors |
David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback |