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Compendium of Surface and Interface Analysis

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Cover of 'Compendium of Surface and Interface Analysis'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Acoustic Microscopy
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    Chapter 2 Action Spectroscopy with STM
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    Chapter 3 Ambient Pressure X-Ray Photoelectron Spectroscopy
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    Chapter 4 Angle-Resolved Ultraviolet Photoelectron Spectroscopy
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    Chapter 5 Atom Probe Field Ion Microscope
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    Chapter 6 Atomic Force Microscope
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    Chapter 7 Auger Electron Spectroscopy
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    Chapter 8 Cathodoluminescence
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    Chapter 9 Conductive Atomic Force Microscopy
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    Chapter 10 Differential Interference Contrast Microscopy/Phase-Contrast Microscopy
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    Chapter 11 Dynamic Secondary Ion Mass Spectrometry
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    Chapter 12 Elastic Recoil Detection Analysis
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    Chapter 13 Electrochemical Atomic Force Microscopy
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    Chapter 14 Electrochemical Infrared Spectroscopy
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    Chapter 15 Electrochemical Scanning Tunneling Microscopy
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    Chapter 16 Electrochemical Second Harmonic Generation
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    Chapter 17 Electrochemical Sum Frequency Generation
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    Chapter 18 Electrochemical Surface X-Ray Scattering
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    Chapter 19 Electrochemical Transmission Electron Microscopy
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    Chapter 20 Electrochemical X-Ray Absorption Fine Structure
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    Chapter 21 Electrochemical X-Ray Photoelectron Spectroscopy
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    Chapter 22 Electron Backscatter Diffraction
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    Chapter 23 Electron Energy-Loss Spectroscopy
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    Chapter 24 Electron Probe Microanalysis
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    Chapter 25 Electron-Stimulated Desorption
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    Chapter 26 Electron-Beam-Induced Current
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    Chapter 27 Ellipsometry
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    Chapter 28 Environmental SEM (Atmospheric SEM)
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    Chapter 29 Environmental Transmission Electron Microscopy
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    Chapter 30 Extended X-Ray Absorption Fine Structure
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    Chapter 31 Focused Ion Beam Scanning Electron Microscope
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    Chapter 32 Force Curve
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    Chapter 33 Force Spectroscopy
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    Chapter 34 Frequency-Modulation Atomic Force Microscopy
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    Chapter 35 Gap-Mode Raman Spectroscopy
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    Chapter 36 Glow Discharge Mass Spectrometry
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    Chapter 37 Glow Discharge Optical Emission Spectrometry
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    Chapter 38 Hard X-Ray Photoelectron Spectroscopy
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    Chapter 39 Helium Atom Scattering
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    Chapter 40 High-Resolution Elastic Recoil Detection Analysis
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    Chapter 41 High-Resolution Electron Energy Loss Spectroscopy
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    Chapter 42 High-Resolution Rutherford Backscattering Spectrometry
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    Chapter 43 High-Speed Atomic Force Microscopy
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    Chapter 44 Imaging Ellipsometry
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    Chapter 45 Impact Collision Ion Scattering Spectroscopy
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    Chapter 46 Inelastic Electron Tunneling Spectroscopy
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    Chapter 47 Infrared External-Reflection Spectroscopy
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    Chapter 48 Infrared Reflection–Absorption Spectroscopy
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    Chapter 49 Interferometer Displacement Measurement
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    Chapter 50 Inverse Photoemission Spectroscopy
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    Chapter 51 Kelvin Probe Force Microscope
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    Chapter 52 Laser Ionization Secondary Neutral Mass Spectrometry
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    Chapter 53 Laser Photoelectron Spectroscopy
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    Chapter 54 Lateral Force Microscopy
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    Chapter 55 Liquid SPM/AFM
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    Chapter 56 Low-Energy Ion Scattering Spectroscopy
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    Chapter 57 Low-Energy Electron Diffraction
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    Chapter 58 Low-Energy Electron Microscope
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    Chapter 59 Magnetic Force Microscopy
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    Chapter 60 Matrix-Assisted Laser Desorption/Ionization
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    Chapter 61 Medium-Energy Ion Scattering
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    Chapter 62 Micro-Raman Spectroscopy
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    Chapter 63 Microprobe Reflection High-Energy Electron Diffraction
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    Chapter 64 Multiple-Probe Scanning Probe Microscope
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    Chapter 65 Nanoscale Angle-Resolved Photoelectron Spectroscopy
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    Chapter 66 Nonlinear Spectroscopy
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    Chapter 67 Nuclear Reaction Analysis
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    Chapter 68 Optical Microscopy
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    Chapter 69 Optical Second-Harmonic Generation Spectroscopy and Microscopy
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    Chapter 70 Particle-Induced X-Ray Emission
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    Chapter 71 Penning Ionization Electron Spectroscopy
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    Chapter 72 Phase Mode SPM/AFM
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    Chapter 73 Photoelectron Diffraction
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    Chapter 74 Photoelectron Holography
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    Chapter 75 Photoelectron Yield Spectroscopy
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    Chapter 76 Photoemission Electron Microscope
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    Chapter 77 Photoluminescence
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    Chapter 78 Photon Emission from the Scanning Tunneling Microscope
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    Chapter 79 Photo-Stimulated Desorption
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    Chapter 80 Piezoresponse Force Microscope
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    Chapter 81 Positron-Annihilation-Induced Desorption Spectroscopy
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    Chapter 82 p-Polarized Multiple-angle Incidence Resolution Spectrometry
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    Chapter 83 Quartz Crystal Microbalance
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    Chapter 84 Reflectance Difference Spectroscopy
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    Chapter 85 Reflection High-Energy Electron Diffraction
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    Chapter 86 Resonant Inelastic X-Ray Scattering
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    Chapter 87 Rutherford Backscattering Spectrometry
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    Chapter 88 Scanning Capacitance Microscopy
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    Chapter 89 Scanning Electrochemical Microscopy
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    Chapter 90 Scanning Electron Microscope Energy Dispersive X-Ray Spectrometry
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    Chapter 91 Scanning Electron Microscopy
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    Chapter 92 Scanning Helium Ion Microscope
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    Chapter 93 Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy
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    Chapter 94 Scanning Probe Microscopy
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    Chapter 95 Scanning Transmission Electron Microscopy
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    Chapter 96 Scanning Transmission X-Ray Microscopy
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    Chapter 97 Scanning Tunneling Microscopy
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    Chapter 98 Scanning Tunneling Spectroscopy
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    Chapter 99 Soft X-Ray Absorption Fine Structure
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    Chapter 100 Spectroscopic Ellipsometry
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    Chapter 101 Spin- and Angle-Resolved Photoelectron Spectroscopy
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    Chapter 102 Spin-Polarized Scanning Electron Microscopy
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    Chapter 103 Spin-Polarized Scanning Tunneling Microscopy
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    Chapter 104 Spin-Resolved Photoemission Electron Microscopy
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    Chapter 105 Super-Resolution Microscopy
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    Chapter 106 Surface Acoustic Wave
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    Chapter 107 Surface Enhanced Raman Scattering
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    Chapter 108 Surface Magneto-Optic Kerr Effect
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    Chapter 109 Surface Plasmon Resonance
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    Chapter 110 Surface Profilometer
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    Chapter 111 Surface Sensitive Scanning Electron Microscopy
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    Chapter 112 Surface X-Ray Diffraction
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    Chapter 113 Surface-Enhanced Infrared Absorption Spectroscopy
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    Chapter 114 Synchrotron Radiation Photoelectron Spectroscopy
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    Chapter 115 Synchrotron Scanning Tunneling Microscope
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    Chapter 116 Thermal Desorption Spectroscopy
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    Chapter 117 Time-of-Flight Secondary Ion Mass Spectrometry
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    Chapter 118 Time-Resolved Photoelectron Spectroscopy
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    Chapter 119 Time-Resolved Photoemission Electron Microscopy
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    Chapter 120 Time-Resolved Scanning Tunneling Microscopy
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    Chapter 121 Tip-Enhanced Raman Scattering
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    Chapter 122 Total Reflection X-Ray Fluorescence
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    Chapter 123 Transmission Electron Diffraction
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    Chapter 124 Transmission Electron Microscope
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    Chapter 125 Ultraviolet Photoelectron Spectroscopy
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    Chapter 126 Ultraviolet–Visible Spectrophotometry
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    Chapter 127 Vibrational Sum Frequency Generation Spectroscopy
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    Chapter 128 X-Ray Absorption Near Edge Structure
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    Chapter 129 X-Ray-Aided Noncontact Atomic Force Microscopy
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    Chapter 130 X-Ray Crystal Truncation Rod Scattering
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    Chapter 131 X-Ray Magnetic Circular Dichroism
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    Chapter 132 X-Ray Photoelectron Spectroscopy
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    Chapter 133 X-Ray Reflectivity
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    Chapter 134 X-Ray Standing Wave Method
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Title
Compendium of Surface and Interface Analysis
Published by
Springer, Singapore, March 2018
DOI 10.1007/978-981-10-6156-1
ISBNs
978-9-81-106155-4, 978-9-81-106156-1
Editors

The Surface Science Society of Japan

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Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 116 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 116 100%

Demographic breakdown

Readers by professional status Count As %
Student > Master 24 21%
Student > Ph. D. Student 17 15%
Researcher 9 8%
Student > Doctoral Student 7 6%
Student > Bachelor 7 6%
Other 15 13%
Unknown 37 32%
Readers by discipline Count As %
Materials Science 20 17%
Physics and Astronomy 18 16%
Chemistry 13 11%
Engineering 11 9%
Medicine and Dentistry 3 3%
Other 11 9%
Unknown 40 34%