↓ Skip to main content

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Overview of attention for book
Overall attention for this book and its chapters
Altmetric Badge

Mentioned by

wikipedia
2 Wikipedia pages

Citations

dimensions_citation
144 Dimensions

Readers on

mendeley
52 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Title
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by
Springer Netherlands, June 2008
DOI 10.1007/978-1-4020-8363-1
ISBNs
978-1-4020-8362-4, 978-1-4020-8363-1
Authors

Pavlov, Andrei, Sachdev, Manoj

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 52 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United States 2 4%
Germany 1 2%
Unknown 49 94%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 20 38%
Student > Master 10 19%
Researcher 8 15%
Student > Bachelor 3 6%
Other 2 4%
Other 9 17%
Readers by discipline Count As %
Engineering 35 67%
Computer Science 7 13%
Physics and Astronomy 4 8%
Unspecified 2 4%
Materials Science 2 4%
Other 2 4%