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Mendeley readers
Title |
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
|
---|---|
Published by |
Springer Netherlands, June 2008
|
DOI | 10.1007/978-1-4020-8363-1 |
ISBNs |
978-1-4020-8362-4, 978-1-4020-8363-1
|
Authors |
Pavlov, Andrei, Sachdev, Manoj |
Mendeley readers
The data shown below were compiled from readership statistics for 52 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
United States | 2 | 4% |
Germany | 1 | 2% |
Unknown | 49 | 94% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 20 | 38% |
Student > Master | 10 | 19% |
Researcher | 8 | 15% |
Student > Bachelor | 3 | 6% |
Other | 2 | 4% |
Other | 9 | 17% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 35 | 67% |
Computer Science | 7 | 13% |
Physics and Astronomy | 4 | 8% |
Unspecified | 2 | 4% |
Materials Science | 2 | 4% |
Other | 2 | 4% |