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Kinetics of strain relaxation in semiconductor films grown on borosilicate glass-bonded substrates

Overview of attention for article published in Journal of Electronic Materials, July 2001
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Title
Kinetics of strain relaxation in semiconductor films grown on borosilicate glass-bonded substrates
Published in
Journal of Electronic Materials, July 2001
DOI 10.1007/s11664-001-0060-9
Authors

P. D. Moran, T. F. Kuech

Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 3. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 14 June 2016.
All research outputs
#7,561,005
of 23,063,209 outputs
Outputs from Journal of Electronic Materials
#238
of 1,367 outputs
Outputs of similar age
#12,930
of 39,085 outputs
Outputs of similar age from Journal of Electronic Materials
#6
of 20 outputs
Altmetric has tracked 23,063,209 research outputs across all sources so far. This one is in the 44th percentile – i.e., 44% of other outputs scored the same or lower than it.
So far Altmetric has tracked 1,367 research outputs from this source. They receive a mean Attention Score of 3.5. This one is in the 14th percentile – i.e., 14% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 39,085 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 10th percentile – i.e., 10% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 20 others from the same source and published within six weeks on either side of this one. This one is in the 1st percentile – i.e., 1% of its contemporaries scored the same or lower than it.