↓ Skip to main content

Characterization of semiconductor devices and wafer materials via sub-nanosecond time-correlated single-photon counting

Overview of attention for article published in Journal of Applied Spectroscopy, July 2013
Altmetric Badge

About this Attention Score

  • Among the highest-scoring outputs from this source (#23 of 175)
  • Average Attention Score compared to outputs of the same age

Mentioned by

wikipedia
2 Wikipedia pages

Citations

dimensions_citation
4 Dimensions

Readers on

mendeley
34 Mendeley
Title
Characterization of semiconductor devices and wafer materials via sub-nanosecond time-correlated single-photon counting
Published in
Journal of Applied Spectroscopy, July 2013
DOI 10.1007/s10812-013-9786-4
Authors

V. Buschmann, H. Hempel, A. Knigge, C. Kraft, M. Roczen, M. Weyers, T. Siebert, F. Koberling

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 34 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United Kingdom 1 3%
United States 1 3%
Unknown 32 94%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 9 26%
Researcher 5 15%
Student > Bachelor 3 9%
Professor > Associate Professor 3 9%
Student > Master 3 9%
Other 7 21%
Unknown 4 12%
Readers by discipline Count As %
Physics and Astronomy 10 29%
Materials Science 8 24%
Engineering 6 18%
Agricultural and Biological Sciences 1 3%
Medicine and Dentistry 1 3%
Other 3 9%
Unknown 5 15%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 3. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 11 December 2021.
All research outputs
#7,414,160
of 22,668,244 outputs
Outputs from Journal of Applied Spectroscopy
#23
of 175 outputs
Outputs of similar age
#64,981
of 194,386 outputs
Outputs of similar age from Journal of Applied Spectroscopy
#1
of 1 outputs
Altmetric has tracked 22,668,244 research outputs across all sources so far. This one is in the 44th percentile – i.e., 44% of other outputs scored the same or lower than it.
So far Altmetric has tracked 175 research outputs from this source. They receive a mean Attention Score of 3.2. This one is in the 25th percentile – i.e., 25% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 194,386 tracked outputs that were published within six weeks on either side of this one in any source. This one has gotten more attention than average, scoring higher than 50% of its contemporaries.
We're also able to compare this research output to 1 others from the same source and published within six weeks on either side of this one. This one has scored higher than all of them