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Life-Cycle Assessment of Semiconductors

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Overall attention for this book and its chapters
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Title
Life-Cycle Assessment of Semiconductors
Published by
Springer-Verlag New York, January 2012
DOI 10.1007/978-1-4419-9988-7
ISBNs
978-1-4419-9987-0, 978-1-4419-9988-7, 978-1-4899-9223-9
Authors

Boyd, Sarah B., Sarah B. Boyd

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Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 101 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 101 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 21 21%
Student > Master 21 21%
Student > Ph. D. Student 16 16%
Student > Bachelor 7 7%
Professor > Associate Professor 4 4%
Other 14 14%
Unknown 18 18%
Readers by discipline Count As %
Engineering 30 30%
Environmental Science 19 19%
Physics and Astronomy 6 6%
Computer Science 3 3%
Business, Management and Accounting 2 2%
Other 11 11%
Unknown 30 30%