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The Importance of Considering Parasitic Heat Losses When Modeling TEG Performance for High-Temperature Applications

Overview of attention for article published in Journal of Electronic Materials, January 2019
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10 Mendeley
Title
The Importance of Considering Parasitic Heat Losses When Modeling TEG Performance for High-Temperature Applications
Published in
Journal of Electronic Materials, January 2019
DOI 10.1007/s11664-019-06974-5
Authors

R. Schwurack, S. Unz, M. Beckmann

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 10 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 3 30%
Student > Doctoral Student 2 20%
Researcher 1 10%
Professor 1 10%
Unknown 3 30%
Readers by discipline Count As %
Engineering 5 50%
Energy 1 10%
Unknown 4 40%