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Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm

Overview of attention for article published in Journal of Applied Physics, June 2019
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About this Attention Score

  • Above-average Attention Score compared to outputs of the same age (54th percentile)
  • High Attention Score compared to outputs of the same age and source (89th percentile)

Mentioned by

twitter
4 X users

Citations

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12 Dimensions

Readers on

mendeley
11 Mendeley
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Title
Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm
Published in
Journal of Applied Physics, June 2019
DOI 10.1063/1.5098307
Authors

John MacHale, Fintan Meaney, Noel Kennedy, Luke Eaton, Gioele Mirabelli, Mary White, Kevin Thomas, Emanuele Pelucchi, Dirch Hjorth Petersen, Rong Lin, Nikolay Petkov, James Connolly, Chris Hatem, Farzan Gity, Lida Ansari, Brenda Long, Ray Duffy

X Demographics

X Demographics

The data shown below were collected from the profiles of 4 X users who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 11 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 11 100%

Demographic breakdown

Readers by professional status Count As %
Other 3 27%
Researcher 2 18%
Professor > Associate Professor 1 9%
Student > Master 1 9%
Unknown 4 36%
Readers by discipline Count As %
Physics and Astronomy 3 27%
Materials Science 1 9%
Chemistry 1 9%
Engineering 1 9%
Unknown 5 45%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 3. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 05 September 2022.
All research outputs
#12,907,845
of 23,269,984 outputs
Outputs from Journal of Applied Physics
#13,686
of 20,654 outputs
Outputs of similar age
#157,447
of 353,630 outputs
Outputs of similar age from Journal of Applied Physics
#33
of 314 outputs
Altmetric has tracked 23,269,984 research outputs across all sources so far. This one is in the 44th percentile – i.e., 44% of other outputs scored the same or lower than it.
So far Altmetric has tracked 20,654 research outputs from this source. They receive a mean Attention Score of 3.7. This one is in the 33rd percentile – i.e., 33% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 353,630 tracked outputs that were published within six weeks on either side of this one in any source. This one has gotten more attention than average, scoring higher than 54% of its contemporaries.
We're also able to compare this research output to 314 others from the same source and published within six weeks on either side of this one. This one has done well, scoring higher than 89% of its contemporaries.