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Characterisation of K-doped Bi4V2O11 by combined XRD and EPMA: A cautionary tale

Overview of attention for article published in Powder Diffraction, January 2013
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Title
Characterisation of K-doped Bi4V2O11 by combined XRD and EPMA: A cautionary tale
Published in
Powder Diffraction, January 2013
DOI 10.1017/s0885715600009829
Authors

C. K. Lee, A. M. Coats, A. R. West

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Professor 1 50%
Student > Ph. D. Student 1 50%
Readers by discipline Count As %
Materials Science 1 50%
Chemistry 1 50%