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SVM-Based Routability-Driven Chip-Level Design for Voltage-Aware Pin-Constrained EWOD Chips

Overview of attention for article published in this source, March 2015
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9 Mendeley
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Article details
Title
SVM-Based Routability-Driven Chip-Level Design for Voltage-Aware Pin-Constrained EWOD Chips
Published by
Association for Computing Machinery (ACM), March 2015
DOI 10.1145/2717764.2717777
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Mendeley demographics

Mendeley demographics

The data shown below were compiled from readership statistics for 9 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Geographical breakdown
Country Count As %
United States 1 11%
Unknown 8 89%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Student > Ph. D. Student 3 33%
Lecturer 2 22%
Student > Bachelor 1 11%
Professor 1 11%
Researcher 1 11%
Other 0 0%
Unknown 1 11%
Readers by discipline
Readers by discipline Count As %
Computer Science 2 22%
Chemistry 2 22%
Engineering 2 22%
Chemical Engineering 1 11%
Physics and Astronomy 1 11%
Other 0 0%
Unknown 1 11%