Fast and Efficient Screening for Wheat Loss-of-Gene Mutants Using Multiplexed Melt Curve Analyses

Overview of attention for article published in PLOS ONE, July 2016

Altmetric Badge

Mentioned by

So far, Altmetric has seen 2 X posts from 2 X users, with an upper bound of 824 followers.

Fast and Efficient Screening for Wheat Loss-of-Gene Mutants Using Multiplexed Melt Curve Analyses. https://t.co/OLuZXKTrso

Fast and Efficient Screening for Wheat Loss-of-Gene Mutants Using Multiplexed Melt Curve… https://t.co/A46L7vbDj1 https://t.co/nebhFLu036

This page shows the most recent X posts that mention this research output. Click here to find out how to access more activity.