Thin film depth profiling by ion beam analysis

Overview of attention for article published in Analyst, January 2016

Altmetric Badge

About this Attention Score

So far, Altmetric has seen 2 X posts from 2 X users, with an upper bound of 1,990 followers.

Thin film depth profiling by Ion Beam Analysis: Analyst, 2016, Accepted ManuscriptDOI: 10.1039/C6AN01167E, Tu... https://t.co/kXUmwK7gJ2

#Analyst: Thin film depth profiling by Ion Beam Analysis: Analyst, 2016, Accepted ManuscriptDOI: 10.1039/C6AN... https://t.co/T2ih5fGqFL

This page shows the most recent X posts that mention this research output. Click here to find out how to access more activity.