Efficient Initial Pose-graph Generation for Global SfM

Overview of attention for article published in this source, June 2021

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 74 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

SIMULTANEOUS LOCALIZATION AND MAPPING METHOD AND APPARATUS, ELECTRONIC DEVICE, AND…

Application WO-2023160445-A1

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.