Pulsed-Laser Testing for Single-Event Effects Investigations

Overview of attention for article published in IEEE Transactions on Nuclear Science, April 2013

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patent: 3 patents

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So far, Altmetric has seen 3 patents that reference this research output.

Efficient laser-induced single-event latchup and methods of operation

Grant US-11774494-B2

United States of America

EFFICIENT LASER-INDUCED SINGLE-EVENT LATCHUP AND METHODS OF OPERATION

Application US-20220390511-A1

United States of America

Efficient laser-induced single-event latchup and methods of operation

Grant US-11435399-B2

United States of America

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