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Deep-level traps in as-grown and electron-irradiated homo-epitaxial n-GaN layers grown by MOVPE

Overview of attention for article published in Microelectronic Engineering, April 2023
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Title
Deep-level traps in as-grown and electron-irradiated homo-epitaxial n-GaN layers grown by MOVPE
Published in
Microelectronic Engineering, April 2023
DOI 10.1016/j.mee.2023.111977
Authors

J. Plesiewicz, P. Kruszewski, V.P. Markevich, P. Prystawko, S. Bulka, M. Hallsal, I. Crowe, L. Sun, A.R. Peaker

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Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 1. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 13 March 2023.
All research outputs
#17,301,727
of 25,394,764 outputs
Outputs from Microelectronic Engineering
#1,851
of 2,003 outputs
Outputs of similar age
#247,393
of 421,804 outputs
Outputs of similar age from Microelectronic Engineering
#2
of 3 outputs
Altmetric has tracked 25,394,764 research outputs across all sources so far. This one is in the 21st percentile – i.e., 21% of other outputs scored the same or lower than it.
So far Altmetric has tracked 2,003 research outputs from this source. They receive a mean Attention Score of 3.8. This one is in the 5th percentile – i.e., 5% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 421,804 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 29th percentile – i.e., 29% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 3 others from the same source and published within six weeks on either side of this one.