Architecture for Highly Reliable Embedded Flash Memories

Overview of attention for article published in this source, April 2007

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Semiconductor memory device and method of controlling the same

Grant US-12413251-B2

United States of America

Semiconductor memory device and method of controlling the same

Grant US-12074616-B2

United States of America

Memory error correction based on layered error detection

Grant US-11716096-B2

United States of America

Semiconductor memory device and method of controlling the same

Grant US-11575395-B2

United States of America

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