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Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors

Overview of attention for article published in IEEE Transactions on Nuclear Science, May 2023
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Title
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
Published in
IEEE Transactions on Nuclear Science, May 2023
DOI 10.1109/tns.2023.3280432
Authors

Zixiang Guo, Kan Li, Xun Li, Xuyi Luo, En Xia Zhang, Robert A. Reed, Ronald D. Schrimpf, Daniel M. Fleetwood, A. Chasin, J. Mitard, D. Linten

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 3 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 67%
Professor > Associate Professor 1 33%
Readers by discipline Count As %
Engineering 2 67%
Unknown 1 33%