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Timeline
Attention over time
Attention Score history
Activity
Mendeley demographics
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| Title |
High Density and Ultra Small Cell Size of Contact ReRAM (CR-RAM) in 90nm CMOS Logic Technology and Circuits
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), December 2009
|
| DOI | 10.1109/iedm.2009.5424408 |
| Authors |
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Mendeley demographics
The data shown below were compiled from readership statistics for 81 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United States | 3 | 4% |
| France | 1 | 1% |
| Unknown | 77 | 95% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 38 | 47% |
| Researcher | 17 | 21% |
| Student > Master | 6 | 7% |
| Professor > Associate Professor | 4 | 5% |
| Other | 2 | 2% |
| Other | 7 | 9% |
| Unknown | 7 | 9% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 58 | 72% |
| Physics and Astronomy | 6 | 7% |
| Materials Science | 5 | 6% |
| Computer Science | 2 | 2% |
| Arts and Humanities | 1 | 1% |
| Other | 1 | 1% |
| Unknown | 8 | 10% |