Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint

Yannick Bonhomme, Patrick Girard, L. Guiller, Christian Landrault, Serge Pravossoudovitch. Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC: International Test Conference, Sep 2003, Charlotte, United Sta

HAL Archives-Ouvertes, 20 Jan 2017

Yannick Bonhomme, Patrick Girard, L. Guiller, Christian Landrault, Serge Pravossoudovitch.