Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint

Overview of attention for article published in this source, January 2003

Altmetric Badge

Mentioned by

news: 1 news outlet

patent: 3 patents

Readers on

mendeley: 6 Mendeley

So far, Altmetric has seen 3 patents that reference this research output.

IP block scan chain construction

Grant US-11256839-B1

United States of America

Low power compression of incompatible test cubes

Grant US-8832512-B2

United States of America

At-speed scan testing with controlled switching activity

Grant US-8499209-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.