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Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM

Overview of attention for article published in IEEE Transactions on Reliability, October 2016
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • One of the highest-scoring outputs from this source (#9 of 494)
  • High Attention Score compared to outputs of the same age (81st percentile)

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