You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Attention Score in Context
| Title |
Characterization of a 28 nm CMOS Technology for Analog Applications in High Energy Physics
|
|---|---|
| Published in |
IEEE Transactions on Nuclear Science, March 2024
|
| DOI | 10.1109/tns.2024.3382348 |
| Authors |
G. Traversi, L. Gaioni, L. Ratti, V. Re, E. Riceputi |
Attention Score in Context
This research output has an Altmetric Attention Score of 6. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 03 April 2024.
All research outputs
#6,677,986
of 25,630,321 outputs
Outputs from IEEE Transactions on Nuclear Science
#742
of 3,848 outputs
Outputs of similar age
#43,704
of 179,801 outputs
Outputs of similar age from IEEE Transactions on Nuclear Science
#1
of 1 outputs
Altmetric has tracked 25,630,321 research outputs across all sources so far. This one has received more attention than most of these and is in the 73rd percentile.
So far Altmetric has tracked 3,848 research outputs from this source. They receive a mean Attention Score of 3.6. This one has done well, scoring higher than 80% of its peers.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 179,801 tracked outputs that were published within six weeks on either side of this one in any source. This one has done well, scoring higher than 75% of its contemporaries.
We're also able to compare this research output to 1 others from the same source and published within six weeks on either side of this one. This one has scored higher than all of them