Benchmarking of X‐Ray Fluorescence Microscopy with Ion Beam Implanted Samples Showing Detection Sensitivity of Hundreds of Atoms

Overview of attention for article published in SMALL METHODS, May 2024

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So far, Altmetric has seen 7 patents that reference this research output.

Sequential array of x-ray imaging detectors

Grant US-12510677-B2

United States of America

30 Dec 2025

High throughput 3D x-ray imaging system using a transmission x-ray source

Grant US-12480892-B2

United States of America

25 Nov 2025

System and method for generating a focused x-ray beam

Grant US-12431256-B2

United States of America

30 Sep 2025

System and method for x-ray absorption spectroscopy using spectral information from two…

Grant US-12429437-B2

United States of America

30 Sep 2025

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