Voltage-Aware Chip-Level Design for Reliability-Driven Pin-Constrained EWOD Chips

Overview of attention for article published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, September 2014

Altmetric Badge

About this Attention Score

Average Attention Score compared to outputs of the same age

Mentioned by

patent: 1 patent

Readers on

mendeley: 10 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

Detection method, system and circuit for connection of digital microfluidic chip and…

Application CN-112415357-A

China

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.