Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study
Overview of attention for article published in Surface and Interface Analysis, September 2004
Altmetric Badge
About this Attention Score
-
In the top 25% of all research outputs scored by Altmetric
-
Among the highest-scoring outputs from this source (#19 of 739)
-
High Attention Score compared to outputs of the same age (82nd percentile)
-
High Attention Score compared to outputs of the same age and source (93rd percentile)
Readers on
- mendeley
- 113 Mendeley