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Timeline
Attention over time
Attention Score history
Mendeley demographics
| Title |
A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), March 2023
|
| DOI | 10.1109/irps48203.2023.10117795 |
| Authors |
Y.H. Lin, C.C. Lee, C.Y. Liao, M.H. Lin, W. C. Tu, Robin Chen, H.P. Chen, Winston S. Shue, Min Cao |
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Mendeley demographics
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 3 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Researcher | 1 | 33% |
| Unknown | 2 | 67% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 1 | 33% |
| Unknown | 2 | 67% |