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A Digital SRAM Modeling for Cell-Aware Testing and Test Algorithms Evaluation

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Title
A Digital SRAM Modeling for Cell-Aware Testing and Test Algorithms Evaluation
Published by
Institute of Electrical and Electronics Engineers (IEEE), July 2025
DOI 10.1109/iolts65288.2025.11116954
Authors

D. Ronga, X. Xhafa, E. Faehn, P. Girard, T. Vayssade, A. Virazel

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