Interconnect Capacitance Characterization Using Charge-Injection-Induced Error-Free (CIEF) Charge-Based Capacitance Measurement (CBCM)
Overview of attention for article published in IEEE Transactions on Semiconductor Manufacturing, February 2006
Altmetric Badge
About this Attention Score
-
Good Attention Score compared to outputs of the same age (77th percentile)
-
Good Attention Score compared to outputs of the same age and source (66th percentile)
Readers on
- mendeley
- 10 Mendeley