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Timeline
Attention over time
Attention Score history
Mendeley readers
| Title |
An SRAM Based Testing Methodology for Yield Analysis of Semiconductor ICs
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), December 2013
|
| DOI | 10.1109/icecs.2013.6815443 |
| Authors |
Jannah Al-Hashimi, Seepsa Tomoq, Khaldoon Abugharbieh, Yazan Al-Qudah, Mustafa Shihadeh |
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Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 7 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 3 | 43% |
| Professor > Associate Professor | 2 | 29% |
| Other | 1 | 14% |
| Unknown | 1 | 14% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 4 | 57% |
| Computer Science | 1 | 14% |
| Unknown | 2 | 29% |