Using a neural network-based approach to predict the wafer yield in integrated circuit manufacturing
Overview of attention for article published in IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part C, January 1997
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In the top 25% of all research outputs scored by Altmetric
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High Attention Score compared to outputs of the same age (88th percentile)
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High Attention Score compared to outputs of the same age and source (83rd percentile)
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