AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis

Overview of attention for article published in this source, January 2008

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So far, Altmetric has seen 2 patents that reference this research output.

SECURE BUILT-IN SELF-TEST (BIST)

Application EP-4625872-A1

European Patent Office

Integrated circuit protections against removal and oracle-guided attacks

Grant US-12039091-B2

United States of America

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