A Prototype of a Wireless-Based Test System

Overview of attention for article published in this source, September 2007

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Method for performing an electrical testing of electronic devices

Grant US-9000788-B2

United States of America

Probing system for integrated circuit devices

Grant US-7904768-B2

United States of America

METHOD FOR PERFORMING ELECTRICAL TESTING OF ELECTRONIC DEVICES

N/A IT-MI20082117-A1

Italy

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