Exploration Methodology for 3D Memory Redundancy Architectures under Redundancy Constraints

Overview of attention for article published in this source, November 2013

Altmetric Badge

Mentioned by

patent: 2 patents

Readers on

mendeley: 2 Mendeley

So far, Altmetric has seen 2 patents that reference this research output.

MEMORY DEVICE AND REPAIR ANALYSIS METHOD FOR THE MEMORY DEVICE

Grant KR-102013185-B1

Republic of Korea

MEMORY DEVICE AND REPAIR ANALYSIS METHOD FOR THE MEMORY DEVICE

Application KR-20170079439-A

Republic of Korea

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.