On determining scan flip-flops in partial-scan designs

Overview of attention for article published in this source, January 1990

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Architecture, system, method, and computer-accessible medium for partial-scan testing

Grant US-9599671-B2

United States of America

Method and apparatus for performing register transfer level scan selection

Grant US-6237121-B1

United States of America

Low cost testing method for register transfer level circuits

Grant US-5748647-A

United States of America

Method and integrated circuit adapted for partial scan testability

Grant US-5710711-A

United States of America

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