On the generation of small dictionaries for fault location

Overview of attention for article published in this source, January 1992

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So far, Altmetric has seen 6 patents that reference this research output.

Fault dictionary based scan chain failure diagnosis

Grant US-9110138-B2

United States of America

Speeding up defect diagnosis techniques

Grant US-8812922-B2

United States of America

Fault diagnosis based on design partitioning

Grant US-8707232-B2

United States of America

Fault dictionary-based scan chain failure diagnosis

Grant US-8615695-B2

United States of America

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