An ATPG-based framework for verifying sequential equivalence

Overview of attention for article published in International Test Conference 2003 (ITC'03), January 1996

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 4 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

Verification of sequential circuits with same state encoding

Grant US-6408424-B1

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.