On Efficient X-handling using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios

Overview of attention for article published in this source, January 2005

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Multi-stage test response compactors

Grant US-10120024-B2

United States of America

Selective per-cycle masking of scan chains for system level test

Grant US-9874606-B2

United States of America

Multi-stage test response compactors

Grant US-9778316-B2

United States of America

Selective per-cycle masking of scan chains for system level test

Grant US-9377508-B2

United States of America

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