Heuristic clustering of circuit elements in a circuit design Grant US-8196074-B2 United States of America 05 Jun 2012
Test generation methods for reducing power dissipation and supply currents Grant US-7865792-B2 United States of America 04 Jan 2011
Test generation methods for reducing power dissipation and supply currents Grant US-7685491-B2 United States of America 23 Mar 2010
Heuristic clustering of circuit elements in a circuit design Grant US-7509611-B2 United States of America 24 Mar 2009