On Generating Pseudo-Functional Delay Fault Tests for Scan Designs

Overview of attention for article published in this source, January 2005

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At-speed scan testing with controlled switching activity

Grant US-8499209-B2

United States of America

Test generation methods for reducing power dissipation and supply currents

Grant US-7865792-B2

United States of America

Test generation methods for reducing power dissipation and supply currents

Grant US-7685491-B2

United States of America

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