Quick Scan Chain Diagnosis using Signal Profiling

Overview of attention for article published in this source, January 2005

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So far, Altmetric has seen 5 patents that reference this research output.

Compound hold-time fault diagnosis

Grant US-8862956-B2

United States of America

Profiling-based scan chain diagnosis

Grant US-8843796-B2

United States of America

Method and system for scan chain diagnosis

Grant US-8689070-B2

United States of America

Scan test circuitry with delay defect bypass functionality

Grant US-8645778-B2

United States of America

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