Testing and Diagnosing Embedded Content Addressable Memories

Overview of attention for article published in this source, January 2002

Altmetric Badge

Mentioned by

patent: 12 patents

Readers on

mendeley: 2 Mendeley

So far, Altmetric has seen 12 patents that reference this research output.

Systems and methods for testing pages of data stored in a memory module

Grant US-9158620-B2

United States of America

Fully-buffered dual in-line memory module with fault correction

Grant US-8745450-B2

United States of America

Fully-buffered dual in-line memory module with fault correction

Grant US-8281191-B2

United States of America

Fully-buffered dual in-line memory module with fault correction

Grant US-8103921-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity, including 8 additional patents.