Automatic Multi-Layer Red-Eye Detection

Overview of attention for article published in IEEE International Conference on Image Processing (ICIP), October 2006

Altmetric Badge

Mentioned by

patent: 5 patents

So far, Altmetric has seen 5 patents that reference this research output.

Red-eye removal systems and method for variable data printing (VDP) workflows

Grant US-9215349-B2

United States of America

Red-eye removal systems and method for variable data printing (VDP) workflows

Grant US-8970902-B2

United States of America

Correcting an artifact in an image

Grant US-8655100-B2

United States of America

Automatic redeye detection based on redeye and facial metric values

Grant US-8446494-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity, including 1 additional patents.