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Detection of Transistor Stuck-open Faults in Asynchronous Inputs of Scan Cells* *Work of Fan Yang and S.M. Reddy was supported in part by SRC Grant No. 2004-TJ-1583 and the work of I. Pomeranz was…

Overview of attention for article published in this source, October 2008
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Title
Detection of Transistor Stuck-open Faults in Asynchronous Inputs of Scan Cells* *Work of Fan Yang and S.M. Reddy was supported in part by SRC Grant No. 2004-TJ-1583 and the work of I. Pomeranz was supported in part by SRC Grant No. 2004-TJ-1244
Published by
Institute of Electrical and Electronics Engineers (IEEE), October 2008
DOI 10.1109/dft.2008.11
Authors

Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz

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Mendeley demographics

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
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Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 2 100%
Readers by discipline Count As %
Engineering 2 100%