Output Test Compression for Compound Defect Diagnosis

Overview of attention for article published in this source, October 2009

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patent: 9 patents

So far, Altmetric has seen 9 patents that reference this research output.

Programmable test compression architecture input/output shift register coupled to SCI/SCO/P…

Grant US-12013434-B2

United States of America

18 Jun 2024

Programmable test compression architecture input/output shift register coupled to SCI/SCO/P…

Grant US-11567131-B2

United States of America

31 Jan 2023

Programmable test compression architecture input/output shift register coupled to SCI/SCO/P…

Grant US-11231463-B2

United States of America

25 Jan 2022

Programmable test compression architecture input/output shift register coupled to SCI/SCO/P…

Grant US-11199583-B2

United States of America

14 Dec 2021

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