A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories

Overview of attention for article published in this source, January 2003

Altmetric Badge

Mentioned by

patent: 3 patents

Readers on

mendeley: 1 Mendeley

So far, Altmetric has seen 3 patents that reference this research output.

Automatic classification of compilers

Grant US-9928042-B2

United States of America

Automatic determination of compiler configuration

Grant US-9672015-B2

United States of America

AUTOMATIC DETERMINATION OF COMPILER CONFIGURATION

Application US-20170090885-A1

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.